1250μM Film Coating Thickness Gauge Large Memory Five Statistics
Large Memory Five Statistics Metal Shell Coating Thickness Gauge With Fe And NFe Function
Functions & Features
● With high quality metal probes and shell.
● Large memory to save 4 types of materials and 1560 testing values.
● Software for PC connection and data transmission, analysis.
● Two measuring methods:continuous and single;
● Two working mode: direct and batch;
● Limit setting function.
● Switch off automatically or manually.
● 3 ways for easy Calibration: by one specimen, two specimens or five specimens to calibrate..
● Five statistics: Average, Maximum, Minimum, Testing times, Standard deviation.
● 3 years warranty and life-long services
Technical Parameters
| Technical Parameters |
| Model No. | Uee922 |
| Measuring principle | Magnetic induction (Fe ) & Eddy current ( NFe) |
| Measuring range (µm) | 0~1250μm |
| Probe | Changeable |
| Shell | Metal |
| Accuracy | ±(2%H+1) μm; H refers to the thickness of testing piece |
| Minimum resolution (µm) | 0.1μm |
| Min curvature of the min area (mm) | Convex1.5 Concave9 |
| Diameter of the min area (mm) | Φ7 |
| Critical thickness of substrate (mm) | 0.5 |
| Memory | 1560 |
| Dimensions | 130*70*30mm |
| Power supply | 2*AA Alkaline battery |
| Standard Configuration |
Main Machine, probe*1(Fe or NFe), substrate*1(Fe or NFe), software & USB, Calibration specimens*5, Users’ Manual, Qualified Certificate, Coin screwdriver, Packing list, Warranty card |
| Optional Accessories | Probes,Specimens |
Substrate
a) Standard methods for magnetic substrate metal magnetic properties and surface roughness, tested should stay with the substrate metal magnetic and surface roughness is similar.For eddy current method, standard pieces of the electrical properties of the metal matrix, and the tested should stay with the substrate similar to the electrical properties of the metal.To confirm the applicability of the standard piece, available
standard piece of base metal and under test on a substrate metal comparing measured by the readings.
b) If under test pieces of metal substrate thickness is no more than the critical thickness stipulated in the table 1, the following two methods can be used for calibration:
1) Stay with the same test pieces of metal substrate thickness metal on-chip calibration standard;
2) With a sufficient thickness, electrical properties of similar metal liner metal standard or specimen, but it must be made between base metal
and liner metal without clearance. On the two sides have cladding specimens, cannot use liner method.
c) If the curvature of the coating under test has reached the calibration can't on the plane, have the covering layer of the curvature of the standard piece or of the curvature of the substrate metal under calibration foils, shall be the same with the curvature of
PC Software:
Software for PC connection and data transmission, analysis.
Packing box: High quality water-proof box
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